Background
Source: Wikipedia
Théodore Simon (French: [simɔ̃]; 10 July 1873 – 4 September 1961) was a French psychiatrist who worked with Alfred Binet to develop the Binet-Simon Intelligence Test, one of the most widely used scales in the world for measuring intelligence. This scale was revised in 1908 and 1911, and served as a template for the development of newer scales. Simon worked at various hospitals throughout France, including Sainte-Anne Hospital Center and Dury-les-Amiens.
